The National Institute of Standards and Technology (NIST) is upgrading the resonant soft X-ray scattering (RSoXS) end station at NSLS-II at the Brookhaven National Laboratory facility. The upgrade will allow for soft X-ray reflectivity and resonant critical dimension small angle scattering (res-CDSAXS) measurements, enhancing the ability to characterize new materials for photolithography. The upgrade must be integrated into existing instrumentation, software, and controllers, and the modified chamber must fit within the current straight section of the SST1 beamline. • The RSoXS end station is used for measuring the microstructure and local chemistry of soft matter systems. • The upgrade will add a high-throughput sample exchange system to increase sample throughput. • The equipment must fit within the existing design envelope and not compromise any part of the previous design. • NIST conducted market research and identified XDS Oxford Limited as the only source capable of meeting the requirements.