Resistivity Measurement System Suite, 4-Point Probe

The Defense Logistics Agency (DLA) is seeking a vendor to supply a complete Resistivity Measurement System Suite, including a 4‑point probe, capable of analyzing semiconductor materials, thin films, and conductive polymers under a variety of physical and thermal conditions. The solicitation was amended to extend the submission window until 18 September 2026, indicating a need for updated technical specifications. The award will provide the Department with a multi‑environment measurement capability for mission‑critical analysis. • Equipment: Resistivity measurement system with 4‑point probe. • Application areas: Semiconductor, thin‑film, conductive polymer analysis. • Performance requirements: Operate across full range of physical and thermal environments. • Delivery: As defined in the updated Performance Work Statement (PWS). • Funding: Not disclosed; typical procurement for specialized scientific instrumentation.