ATOMIC FORCE MICROSCOPE (AFM)

Grambling State University is seeking bids for the purchase of an Atomic Force Microscope (AFM) system. The AFM system should be a complete scanning probe microscopy system capable of high-resolution imaging and characterization of nanomaterial samples. The system should meet or exceed all minimum technical and performance requirements contained in the specifications, including standard and advanced AFM imaging modes, environmental isolation, motorized stages, microscope vision support, controller, computer, and software. The successful bidder shall provide all equipment, hardware, software, computers, accessories, components, and other items necessary for the system to perform the required functions. Some key features of the AFM system include: • A complete 3D scanning system with electronics and accessories for high-resolution imaging • Main AFM unit with standard topography imaging modes operated on contact mode, tapping mode, and non-contact mode • Ability to integrate with a custom confocal microscope for combined AFM and confocal experiments • Accommodate large samples with sizes up to 50 x 50 x 20 mm (XYZ) and must come with a fully motorized XY sample and Z stages • An active vibration isolation system and acoustic enclosure • PC and SPM control and analysis software