Non-Volatile Memory Susceptibility Prediction

The Defense Microelectronics Activity (DMEA) in McClellan, California has issued a Sources Sought notice to identify qualified vendors capable of providing predictive analysis of non‑volatile memory (NVM) susceptibility to environmental stressors (e.g., radiation, temperature, voltage). The effort is intended to support future DOD programs that rely on reliable NVM components. Respondents would be expected to demonstrate expertise in semiconductor physics, reliability modeling, data‑driven prediction techniques, and possibly deliver prototype prediction tools or reports. • Scope: Develop or supply predictive models/algorithms for NVM failure mechanisms. • Required expertise: Microelectronics reliability, physics‑based modeling, statistical analysis, software implementation. • Intended use: Inform DOD acquisition decisions and risk assessments for NVM‑based systems. • No contract award or budget is disclosed at this stage; this is a market‑research solicitation. • Interested parties should submit capability statements and relevant past performance.